Varela M., Arenholz E., Liu K., Takamura Y., Murray P.D., Gilbert D.A., Grutter A.J., Kirby B.J., Hernandez-Maldonado D., Brubaker Z.E., Liyanage W.L., Chopdekar R.V., Taufour V., Zieve R.J., Jeffries J.R., Borchers J.A.
Laan D.C., Knoll A., Carota G., Hazelton D., Jaroszynski J., Abraimov D., Weiss J.D., Francis A., Bradford G., Small M.A.
Ключевые слова: thermal stability, stabilizing layers, Cu-based conductors, resistance, thickness dependence, overcurrent, critical caracteristics, current-voltage characteristics, time evolution, ac performance, current waveforms, voltage waveforms, transient performance, experimental results, HTS, GdBCO, coated conductors
Holzapfel B., Hanisch J., Nast R., Driessche I.V., Erbe M., Cayado P., Rijckaert H., Buysser K.D., Sierra J.D., Dominguez P.L.
Ключевые слова: chemical solution deposition, inkjet printing, HTS, YBCO, nanocomposites, substrate LaAlO3, thin films, nanodoping, critical caracteristics, critical current density, thickness dependence, X-ray diffraction, microstructure, angular dependence, Jc/B curves, magnetic field dependence, pinning force, fabrication, experimental results
Ключевые слова: HTS, REBCO, coated conductors, substrate stainless steel, stabilizing layers, thickness dependence, cables current limiting, design, design parameters, impedance, temperature rise , resistance, temperature dependence, critical caracteristics, current-voltage characteristics, fault currents, length, modeling, numerical analysis
Gomory F., Vojenciak M., Skarba M., Pekarcikova M., Drienovsky M., Cuninkova E., Mosat M., Buran M., Misнk J., Krajcovic J., Hulan T.
Ключевые слова: MgB2/Ta/Cu/, wires, barriers, interfaces, thickness dependence, current transfer, geometry effects, modeling, numerical analysis
Malagoli A., Ferdeghini C., Mancini A., Vannozzi A., Celentano G., Braccini V., Putti M., Manfrinetti P., Pallecchi I., Bernini C., Bellingeri E., Leveratto A., Sylva G., Lisitskiy M., Manca N., Provino A.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.